Date: November 3, 2026
Sønderborg, Denmark
Discover how cutting-edge electron microscopy (SEM/EDX), ion beam processing and mass spectrometry (FIB/SIMS) can reveal the structure and chemistry of materials at the nanoscale.
What to Expect:
Following a day of expert lectures and a live instrument demonstration, participants will have the opportunity to book exclusive hands-on sessions on the new dual-beam SEM/FIB-SIMS instrument to analyze their own samples or discuss specific challenges with specialists.
Event Highlights:
- A workshop featuring expert talks from leading specialists in the field.
- Practical demonstrations covering measurement workflows and data analysis.
Sample Testing:
Test measurements on your own samples will take place on November 4–5. Please indicate your interest by selecting the appropriate option during registration.