We’re excited to announce the arrival of our new Thermo Scientific Helios 5 DualBeam FIB-SEM-SIMS instrument, a major upgrade for NANOCHEM at SDU Sønderborg
This advanced system combines Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) with secondary ion mass spectrometry (SIMS), enabling high-resolution 3D nanoscale chemical imaging.
With this new instrument, we can now:
🔹 Perform quantitative elemental and isotopic analysis below 50 nm
🔹 Generate 3D reconstructions of complex materials
🔹 Combine morphology, structure, and chemistry in one workflow
This addition strengthens NANOCHEM’s role in supporting academic and industrial collaborations in materials characterization.
